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Ion Diagnostics

NSTX-U Ion Diagnostics Measurement Capabilities – January 2015

(black – available for experiments, blue – under active development)

Physics Measurement

Typical range and coverage

Spatial; Temporal Resolution

Typical Precision

Available Diagnostic Techniques

Comment

Contact

Ion temperature profile

0.02 – 5.0 keV

3.0 cm core,

0.5 cm edge, 10 ms

≥ 2%

Toroidal CHERS

51 channels system using C VI with heating beam, dedicated background view

R. Bell, M.Podestà – PPPL

 

3.0 cm edge only, 10 ms

≥ 2%

Edge Doppler spectroscopy

7 channels from tangential view and 6 channels from vertical view of outer midplane edge.  Uses intrinsic C III and He II.

R. Bell, M.Podestà – PPPL

Plasma rotation profile

-100 km/s to +300 km/s

3.0 cm core,

0.5 cm edge, 10 ms

≥ 2%

Toroidal CHERS

See above

R. Bell, M.Podestà – PPPL

 

~ 3.0 cm edge only, 10 ms

≥ 2%

Edge Doppler spectroscopy

See above

R. Bell, M.Podestà – PPPL

 

1.6 cm core,

0.6 cm edge, 10 ms

 

Poloidal CHERS

Up and down views of heating beam and dedicated background views, 75 active channels using C VI with heating beam.

R. Bell, M.Podestà – PPPL

-100 km/s to +300 km/s

4 radial channels; up to 5kHz sampling rate

 

Real-time toroidal CHERS

4 channels measuring C VI, active and passive (background) views, fast acquisition and analysis for real-time velocity data

M.Podestà, R. Bell – PPPL

ExB  flow Core plasma

5MHz BW

Dr ~ 1cm

 

Quadrature Doppler Backscattering (DBS)

1 Channel, 96 GHz (2015)

4 Channels (2016)

S. Kubota - UCLA

 

Measures plasma emission up to 40 GHz with sub-millisecond time resolution.

 

Synthetic Aperture Microwave Imaging (SAMI)

Compact array of microwave receiving antennas. Two antennas can be configured to launch microwaves for imaging reflectometry.

 

Measures EBW emission as a function of poloidal and toroidal angle, allowing high radial resolution measurements of edge magnetic field pitch. Also can be configured for imaging relectometry to measure edge plasma flows.

G. Taylor – PPPL

R. Vann – University of York, UK

Profile of the radial Electric field

 

 

 

5 cm core, 2 cm edge, 10 ms

 

MSE/CIF and MSE/LIF

See above; requires heating source A and DNB

F. Levinton, H. Yuh, Y. Sechrest - Nova Photonics

 

3.0 cm core,

0.5 cm edge, 10 ms

 

Toroidal and poloidal CHERS

See above; requires heating beam

R. Bell, M.Podestà – PPPL

 

3.0 cm, 10 ms

 

Edge Doppler spectroscopy

May need helium

R. Bell, M.Podestà – PPPL

Radiation profile 

 

2-3 cm, 0.2 ms

 

Toroidal bolometer array

Tangential view, 40 channels (AXUV diode arrays)

L. Delgado-Aparicio - PPPL

Lower divertor area

1-2 cm, 10-20 kHz

 

Divertor radiometer (bolometer) array, can be used with Ly-alpha filter

Vertical view, 20 channel AXUV diode array

V. Soukhanovskii - LLNL

Zeff

 

line integral

10% abs.

Visible continuum sensor

Single filterscope chord, RTAN~60 cm

C. Skinner - PPPL

 

3.0 cm core,

0.5 cm edge, 10 ms

≥ 5% in (Zeff-1)

Toroidal CHERS

See above, assumes C only impurity

R. Bell, M.Podestà – PPPL

Impurity concentrations

C+5 conc.

3.0 cm core,

1.0 cm edge, 10 ms

20% abs.

Toroidal CHERS

See above

R. Bell, M.Podestà – PPPL

H/D ratio, survey, impurity studies

Integral; 10 ms

5% (rel)

Ultraviolet-visible survey spectrometer VIPS-2

3 (10) sightlines coupled via fiber to 0.5 M Czerny-Turner; 350-1100 nm, CCD detector.

V. Soukhanovskii - LLNL

Z≥3 ions (Li, B, C, O, Cu, Ne, Ar, Fe, Kr, Mo)

5 cm; 5 ms for impurities

15% abs

Filtered poloidal soft x-ray arrays

2 horizontal arrays (32 ch); discrete AXUV diode arrays

K. Tritz, J. M. Burgos– JHU

1 cm, < 10 kHz

5% (rel)

Tangential multi-color SXR arrays

5 color/ 20 spatial channels, AXUV diode arrays

K. Tritz, J. M. Burgos – JHU

r/a~0.08, 10 ms

15% abs

TGI spectrometer

12 chord transmission grating imaging spectrometer; 10Å – 300Å CCD camera

K. Tritz, J. M. Burgos – JHU

Integral; 12 ms

5% (rel)

EUV spectrometer (XEUS)

Flat field grazing incidence spectrometer covering 5-60 Å

P. Beiersdorfer-LLNL

Integral; 12 ms

5% (rel)

EUV spectrometer (LoWEUS)

Flat field grazing incidence spectrometer covering 220-400 Å

P. Beiersdorfer-LLNL

 

Integral; 12 ms

5% (rel)

EUV spectrometer (MonaLisa)

Flat field grazing incidence spectrometer covering 60-220 Å

P. Beiersdorfer-LLNL